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Defect oriented testing for CMOS analog and digital circuits
Material type:
TextPublication details: Boston Kluwer Academic Publishers 1998ISBN: - 0792380835
| Item type | Current library | Call number | Status | Date due | Barcode | |
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Goa University Library General Stacks 2 | 621.3815 SAC/Def (Browse shelf(Opens below)) | Available | 091131 |
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| 621.3815 PIE/Ana Analogintegrated circuits and signal processing | 621.3815 RAS/Mic Microelectronic circuits : Analysis and design | 621.3815 ROB/Sol Solid State Circuit Analysis | 621.3815 SAC/Def Defect oriented testing for CMOS analog and digital circuits | 621.3815 SAL/Ele Electronic devices and circuits | 621.3815 SCH/Eda-1 EDA for IC system design, verification, and testing | 621.3815 SCH/Eda-2 EDA for IC implementation, circuit design, and process technology |
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